Investigation on the Valance Band Structure of HOPG Using Ultraviolet Photoelectron Spectroscopy System
ID：100
Submission ID：206 View Protection：ATTENDEE
Updated Time：2024-10-23 10:28:30
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Oral Presentation
Start Time：2024-11-02 10:30 （Asia/Shanghai）
Duration：20min
Session：[P3] Parallel Session 3 » [P3-2] Parallel Session 3（November 2 AM）
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Abstract
This paper provides a basic introduction to the principles and instrumentation of ultraviolet photoelectron spectroscopy (UPS), ultraviolet photoelectron yield spectroscopy (PYS), and constant final state- yield spectroscopy (CFS-YS) measurements. It’s performed different measurements of HOPG and compared the results, deciding a series of electronic energy level parameters such as work functionΦ= 4.56 eV, valance band energy EVBM= 0.87 eV, and ionization energy Ith= 5.35 eV. It offers an initial understanding of the surface electronic structure via ultraviolet photoelectron spectroscopy method. It’s also demonstrated that ultraviolet photoelectron spectroscopy is an effective method for characterizing the electronic structure of materials.
Keywords
Ultraviolet Photoelectron Spectroscopy, HOPG, Electronic Structure
Speaker
HouXiaohan
None Xi'an Jiaotong UniversitySubmission Author
All comments
15th August 2024 31st August 2024- Manuscript Submission
15th September 2024 - Acceptance Notification
1st October 2024 - Camera Ready Submission
1st October 2024 – Early Bird Registration
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